In this paper, based on the build-in self-test for logic circuits, a new approach is proposed to reduce pseudorandom test sequence length. 本文建立在逻辑电路内部自测试的基础上，提出了一种新的缩短伪随机测试序列长度的方法。
The resulting value must be a nonnegative integer less than the sequence's length, and the sequence is asked to assign the assigned object to its item with that index. 最后的值必须是一个小于该序列长度的非负整数，然后该序列就被请求将被赋对象赋值给它带那个指标的项。
